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Burn-in, Reliability & Life Test System

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Die Inspection System

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LED Light Bar Test System

LED Test Modules

 

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LED Test & Automation Instruments

58173

The LED industry has grown as a result of greater interest in energy savings and environmental protection.

 

The production process of an LED module starts from Epitaxy (EPI) to Chip Process and then ends with Package. Different LED products are designed to meet the diversified requirements of various industries such as mobile phones, vehicle lamps, LCD backlight sources and etc.

Chroma's LED test equipment can be applied to die saw and expansion prior or subsequent for electricity, optics, and electrostatic discharge (ESD) tests. With the user interface integrated prober it can inspect the LED rapidly. For package phase, it can perform electrostatic discharge, thermal resistance and tri-temperature tests to simulate the environment changes in temperature and humidity for measuring the electrical and optical characteristics of LED. Furthermore, it can perform life cycle tests on LED Flash Light, LED Light Bar and OLED for LED modules. This solution also provides various customized LED electrical and optical test equipment for diverse test applications.

Click here for more information on Chroma's turn-key LED solutions.

Burn-In, Reliability and Life Test Systems
58601
Model 58601
Optoelectronic Source Measurement System
  • For Burn-In, Reliability and Life Testing
  • Up to 800 channels
  • Up to 40A per device
  • Up to 150° C
58266
Model 58266
LED AC/DC Burn-in Test System

  • Multi-channel AC test function : 48ch, 100ch, 200ch or more
  • Programmable AC source
  • AC parameter real time monitor
  • Optional DC and optical test functions are available
58267
Model 58267
LED Test System

  • Multi-channel DC test function: 64ch or more
  • Multi-channel optical test function: Over 100 PCS of packaged LED, LED bulb 63PCS, LED T5/T8 Bar 10PCS
 
LED Wafer / Chip Test Prober
58173
Model 58173
LED Total Power Test System

  • Chroma® Huge Photo Detector
  • New method and unique design for LED total power measurement
  • High speed automatic LED wafer/chip prober machine
  • 6" wafer chuck on board
58153
Model 58153
LED Wafer / Chip Prober

  • 100 ms index time
  • Performing scanning tests forth and back from center to one side and return to center for another side.
  • Automatically skip around the defective chips
58150
Model 58150
Configurative LED System

  • Easy to use software interface
  • 30 degree ø rotation range
  • Auto chip horizontal adjustment
 
Die Inspection System
7930
Model 7930
Die Inspection System
  • High speed inspection for LED die wafer
  • Auto Compensation for wafer Z-axis leveling
  • Fast auto focus function are used for clearly acquisition images
   
 
Benchtop Test Systems
58151
Model 58151
Optoelectronic Test System
  • High speed measurement for current and voltage 
  • High speed spectrum analysis for wavelength/color measurement 
  • Complete whole test within 90ms (selected test items)
58154
Model 58154
ESD Test System
  • Two Model ESD Pulse Generation : Human body model and Machine model
  • Programmable Auto Test : Pulse delay, cycle and polarity are programmable
58173-M
Model 58173-M
LED Total Power Test System

  • Chroma® Huge Photo Detector
  • New method and unique design for LED total power measurement
  • Dual test platform (wafer/chip chuck and packaged LED holder)
  • Wide range of electrical test
 
LED Light Bar Test System
Customized Luminaire In-Line Test System
Model 58158-SC
Luminaire In-Line Test System
  • Mass production application: LED lamp, LED bulb, LED bar, LED streetlight, and other luminaires
  • Less error compared to integrating sphere measurement
58182
Model 58182
Top-view LED Light Bar Test System
  • Measure the top-view light bar uniformity composed of white light or RGB LED
  • Equipped with image recognition function to capture the LED location accurately
58185
Model 58185
Side-view LED Light Bar Test System
  • Measure the side-view light bar uniformity composed of white light or RGB LED
  • Excellent optical performance
  • ESD damaged sorting function
 
LED Test Modules
58182
Model 58221
LED Electrical Test Module

  • Focused on High voltage (HV) and High Power (HP) LED application design
  • Hardware sequencer/ program memory / data memory built inside
58185
Model 58222
Multi-Channel Constant Current Regulator

  • Each channel supports up to 500 mA / 400 V
  • Programmable constant current output
  • Fast rising time <1 ms

 

 
                 
 
 
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