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Model 52400e Series High Precision Source Measure Unit
The Chroma 52400e series is a PXIe based SMU (Source Measurement Unit) card designed for highly accurate source or load simulation with precision voltage and current measurements.
The SMU combines four-quadrant operation with precision and high speed measurement. This makes the SMU an ideal instrument in many parametric test applications ranging from ICs, two-leaded components such as sensors, LEDs, laser diodes, transistors, to solar cells, batteries and many other electronic devices.
The 52400e series features: 16 selectable control bandwidths to ensure high speed output and stable operation; multiple source/measure ranges with an 18-bit DAC/ADC to provide the best resolution and accuracy available with a sampling rate up to 100K s/S; programmable internal series resistance for battery simulation; ±force, ±sense and ±guards lines to avoid leakage current and reduce settling time -- especially useful for low current test applications.
The 52400e series has a patented hardware sequence engine that uses deterministic timing to control each SMU. The sequencer's on-board memory can store up to 65535 sequencer commands and 32k measurement samples per channel, allowing cross module/ card synchronization and latency free output control and measurement. No PC communication is required during execution of the hardware sequencer test process.
C, C#, LabView, LabWindows APIs and versatile soft front panels come standard with each SMU. The back connectors are compatible with both PXIe and hybrid chassis. All of these features enable easy integration to PXIe or PXI-hybrid systems designed for a wide range of applications.
FOUR QUADRANT OPERATION
CONTROL BANDWIDTH SELECTION
To reduce test times, Chroma's SMUs are designed for fast response providing high speed output voltage and current. The impedance of the DUT, fixture, or cabling may cause loop instability under voltage or current source mode. An unstable loop can cause saturation, oscillation, or even damage the DUT.
To prevent system instability, the 52400e series SMUs provide 16 user selectable control bandwidths, eliminating the need for external capacitors or inductors placed near the DUT. This results in faster output rise time, reduced voltage ripple and noise, and reduced transient response. The control bandwidth can be modified via software to maximize test flexibility and minimize downtime when changing DUTs.
UNIQUE HARDWARE SEQUENCER
The Chroma Hardware Sequencer is a powerful tool that can predefine commands as instrument executable steps. This allows latency free control and measurement since no PC interaction is required during execution. Once the instrument receives the start trigger, it will execute step commands in the sequencer table line by line or as defined by the trigger. Shown below are the soft panels for the SMU in hardware sequencer mode (left) and direct operation mode (right).
GUARDING FOR LOW CURRENT APPLICATION
Guarding is an important technique for very-low current measurements. Guarding reduces leakage current error and decreases settling time. This is achieved by keeping the potential of the guard connector at the same potential as the force conductor, so current does not flow between the force and guard conductors. Guarding also eliminates the cable capacitance between the SMU and DUT.
The Chroma 52400e series features two ±guard wires per channel, resulting in faster and more accurate measurements.
For maximum flexibility, the Chroma 52405e SMUs support Master/Slave operation when higher current under FVMI (Force Voltage Measure Current) mode is required. To ensure accurate current sharing between modules and maximum performance, Master/Slave operation is only allowed between SMUs of the same model number.