Key Features High speed tray-based CMOS image sensor inspection system Complete chip appearance inspection including glass and ball side of the chip On-fly acquisition can get clear images and reduce processing time. Multi-nozzles pick & place technology (patented) to improve throughput Advance and flexible illumination modules are suitable for specific defect mode Adjustable inspection criteria can be set for different type of the chip

The Chroma 7970 CMOS Image (CIS) Sensor Inspection System is an automatic inspection system for tray-based CMOS image sensors. There are five main stations in Chroma 7970: loader, ball side inspector, optical side inspector, sorter and unloader. Each station can operate simultaneously to increase inspection time.

The appearance feature of image sensor and defects on it can be clearly conspicuous by using advanced illumination technology. Illumination condition can be adjusted depended on the type of image sensor. Applied with high speed camera and software algorithms, the throughput can reach UPH 6600 for 4mmX4mm chip size.

In addition, Chroma 7970 owns a friendly user interface to reduce user’s learning time. All of inspection information, like tray map, station condition, is visualized for easy reading.