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Solar Photovoltaic Cell Production
A Complete, Automated Solution Click on each station to learn more about automated turnkey PV solutions from Chroma ATE. ![]()
Solar Wafer Inspection System
KEY FEATURES
OVERVIEW Integrated with 2D Geometry, Surface, Micro Crack, Saw mark inspection system and Resistively & Thickness, Lifetime tester by customer defined, Chroma 3710 is a fully user configuration wafer sorter system with very low breakage rate and high throughput. Chroma 3710 solar wafer inspection system is ideal for PV incoming process. Plus wafer can be sorted by user defined algorithm fully automatically into coin stack or cassette. The unique auto coin stack / cassette exchange feature eliminates system down time when changing full coin stack/cassette to empty coin stack / cassette manually. For the breakage rate that is one of the key concern for PV wafer handling system. Chroma 3710 uses state-of-the-art cell transportation technique to ensure minimum breakage rate. Loading Auto-unloading Manual-unloading.
c-Si Cell Color Classifier
KEY FEATURES
OVERVIEW Among several factors for PV to achieve grid-parity, reliability of the PV modules
plays an important roll. Since it’s known that some of the cell defects such as
edge chips/flakes, bumps of cell surface were proved to be source of infant
mortality of the c-Si PV modules, therefore, to defect those defects is very
important for c-Si cell manufacturers. Due to the increasing BIPV and rooftop application, even for those defects that does not directly link to reliability issues such as water mark, surface stain, have to detected and considered as fail or secondary grade of cells for c-Si cell buyers. Conventionally, those defects were visually inspected by operators. But, the inconsistent inspect result makes fully automatic optical inspection (AOI) solution becomes unavoidable equipment for c-Si cell lines. Chroma 7200 series are specially designed for detection yield for wide variety of defects observed for c-Si cells for all sizes and crystallizations.
The Chroma 7211-D c-Si cell color classifier was designed to provide high repetitive color
classification for c-Si PV cells. CIE 1931 Lab color space and up to 60x60 grids for entire
cell surface allows Chroma 7211-D to provide numeric color severities down to each
of the 3600 blocks throughout the cell under test. By using the color information of
each block and user definable algorithm, the user may determine the represented color for
non-uniform color cells such as poly-crystalline cells or cells that have uneven anti-reflection
coating thicknesses. Chroma 7211-D can be used immediately after the anti-reflection coating process to ensure only cells with acceptable color uniformity go down to metallization process.Failed cells may then be sent for re-work. It can also be integrated to in-line or off-line sorter for final inspection prior to shipping.
Frontside Printing & Surface Inspection System
KEY FEATURES
OVERVIEW Among several factors for PV to achieve grid-parity, reliability of the PV modules
plays an important roll. Since it’s known that some of the cell defects such as
edge chips/flakes, bumps of cell surface were proved to be source of infant
mortality of the c-Si PV modules, therefore, to defect those defects is very
important for c-Si cell manufacturers. Due to the increasing BIPV and rooftop application, even for those defects that does not directly link to reliability issues such as water mark, surface stain, have to detected and considered as fail or secondary grade of cells for c-Si cell buyers. Conventionally, those defects were visually inspected by operators. But, the inconsistent inspect result makes fully automatic optical inspection (AOI) solution becomes unavoidable equipment for c-Si cell lines. Chroma 7200 series are specially designed for detection yield for wide variety of defects observed for c-Si cells for all sizes and crystallizations.
CHROMA MODEL 7212-HD
Chroma 7212-HD can be used right after front-side process to retire cells with major defects. This allows best use of the capacity of the following process like I-V testing and sorting which is known to be one of the bottlenecks of c-Si cell line. It can also be integrated to in-line or off-line sorter for final inspection prior to shipping. Backside Printing and Surface Inspection System
KEY FEATURES
OVERVIEW Among several factors for PV to achieve grid-parity, reliability of the PV modules
plays an important roll. Since it’s known that some of the cell defects such as
edge chips/flakes, bumps of cell surface were proved to be source of infant
mortality of the c-Si PV modules, therefore, to defect those defects is very
important for c-Si cell manufacturers. Due to the increasing BIPV and rooftop application, even for those defects that does not directly link to reliability issues such as water mark, surface stain, have to detected and considered as fail or secondary grade of cells for c-Si cell buyers. Conventionally, those defects were visually inspected by operators. But, the inconsistent inspect result makes fully automatic optical inspection (AOI) solution becomes unavoidable equipment for c-Si cell lines. Chroma 7200 series are specially designed for detection yield for wide variety of defects observed for c-Si cells for all sizes and crystallizations. Base on the process needs, three inspectors are available for both in-line and final sorting requirements.
CHROMA MOEL 7213-AD
Another model Chroma 7213, with same inspection capability but was designed for special upward-detection. This brings unparallel advantage against
conventional downward-detection design. With upward detection, the cell can be checked without being flipped twice which helps to minimize the cell
breakage and reduce the production line length. Same as Chroma 7212-HD, Chroma 7213-AD can be used after back-side process to retire cells with major defects. It can also be integrated to in-line
Final Classification & Sorting System
KEY FEATURES
CHROMA MODEL 3730 Chroma 3730 Solar Cell Inspection Test / Sorting System is ideal for PV backend process. In
loader it can automatically pick up and place PV cell finished by firing. Then it will inspect
cell surface and backside defects and will automatically sort the cells into carrier by different
efficiency and color classes defined by customers' request. Breakage rate is a key concern for PV cell handling systems. Chroma 3730 uses state-of-the-art cell transportation techniques to ensure minimum breakage rate. Based on customer’s requirement of different processes, the carrier type and the amount of sorting bins also can be designed and adjusted.
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