Solar Wafer Inspection System

KEY FEATURES

• Good for 5 inches and 6 inches wafer
• High throughput and low breakage rate ≤0.2%
• 2D Geometry Inspection
• Surface Inspection
• Micro Crack Inspection
• Saw Mark Inspection
• Resistively/ Thickness Tester
• Lifetime Tester
• Easy trouble shooting
• Loader : Coin stack / Cassette
• Unload : Coin stack / Cassette

 

OVERVIEW

Integrated with 2D Geometry, Surface, Micro Crack, Saw mark inspection system and Resistively & Thickness, Lifetime tester by customer defined, Chroma 3710 is a fully user configuration wafer sorter system with very low breakage rate and high throughput.

Chroma 3710 solar wafer inspection system is ideal for PV incoming process. Plus wafer can be sorted by user defined algorithm fully automatically into coin stack or cassette. The unique auto coin stack / cassette exchange feature eliminates system down time when changing full coin stack/cassette to empty coin stack / cassette manually.

For the breakage rate that is one of the key concern for PV wafer handling system. Chroma 3710 uses state-of-the-art cell transportation technique to ensure minimum breakage rate. Loading Auto-unloading Manual-unloading.

 

 

CHROMA MODEL 3710

c-Si Cell Color Classifier

KEY FEATURES

• Color inspection with CIELAB color model
• Easily set-up in new or existing production line
• Integration with monitor and computer providing quick and simple installation
• Adjustable criteria for different process
  application or model
• Multiple interface to communication with manufacturing equipment or information system
• Various defects inspecting capability from multilayer LED lighting design
• Flexible programming editor for monocrystalline multicrystalline silicon solar cells
• Dimension and color calibration for accurate measurement results

OVERVIEW

Among several factors for PV to achieve grid-parity, reliability of the PV modules plays an important roll. Since it’s known that some of the cell defects such as edge chips/flakes, bumps of cell surface were proved to be source of infant mortality of the c-Si PV modules, therefore, to defect those defects is very important for c-Si cell manufacturers.

Due to the increasing BIPV and rooftop application, even for those defects that does not directly link to reliability issues such as water mark, surface stain, have to detected and considered as fail or secondary grade of cells for c-Si cell buyers. Conventionally, those defects were visually inspected by operators. But, the inconsistent inspect result makes fully automatic optical inspection (AOI) solution becomes unavoidable equipment for c-Si cell lines. Chroma 7200 series are specially designed for detection yield for wide variety of defects observed for c-Si cells for all sizes and crystallizations.

Light Blue

Dark Blue

Purple

Mixed Color

 

CHROMA MODEL 7211-D

The Chroma 7211-D c-Si cell color classifier was designed to provide high repetitive color classification for c-Si PV cells. CIE 1931 Lab color space and up to 60x60 grids for entire cell surface allows Chroma 7211-D to provide numeric color severities down to each of the 3600 blocks throughout the cell under test. By using the color information of each block and user definable algorithm, the user may determine the represented color for non-uniform color cells such as poly-crystalline cells or cells that have uneven anti-reflection coating thicknesses.

Chroma 7211-D can be used immediately after the anti-reflection coating process to ensure only cells with acceptable color uniformity go down to metallization process.Failed cells may then be sent for re-work. It can also be integrated to in-line or off-line sorter for final inspection prior to shipping.

 

 

 

Frontside Printing & Surface Inspection System

KEY FEATURES

• Capable to integrate to any c-Si cell line due to compact sizes
• Adjustable criteria for different process application or model
• Flexible algorithms programming editor for mono-crystalline and multi-crystalline silicon solar cells
• Multiple interface to communication with manufacturing equipment or information system
• Various defects inspection capability from multilayer LED lighting design
• Flexible design that can easily integrate to your in-line printing system and sorting system

 

OVERVIEW

Among several factors for PV to achieve grid-parity, reliability of the PV modules plays an important roll. Since it’s known that some of the cell defects such as edge chips/flakes, bumps of cell surface were proved to be source of infant mortality of the c-Si PV modules, therefore, to defect those defects is very important for c-Si cell manufacturers.

Due to the increasing BIPV and rooftop application, even for those defects that does not directly link to reliability issues such as water mark, surface stain, have to detected and considered as fail or secondary grade of cells for c-Si cell buyers. Conventionally, those defects were visually inspected by operators. But, the inconsistent inspect result makes fully automatic optical inspection (AOI) solution becomes unavoidable equipment for c-Si cell lines. Chroma 7200 series are specially designed for detection yield for wide variety of defects observed for c-Si cells for all sizes and crystallizations.

Chipping

Discoloration

Finger Width

Stains

 

CHROMA MODEL 7212-HD

Defects causes by front-side (sunny side) printing process of c-Si PV cells may cause performance, reliability or appearance impact. Therefore, a reliable and repetitive inspection to defects such as losing Ag paste on busbars, gridline interruptions, printing shift or rotation, water mark etc., have to be detected and avoid shipping those cells to ensure shipping quality. Chroma 7212-HD c-Si cell front-side printing inspector equips with high resolution CCD camera and superior software algorithm to recognize the unwanted defects on front-side of c-Si PV cells.

Chroma 7212-HD can be used right after front-side process to retire cells with major defects. This allows best use of the capacity of the following process like I-V testing and sorting which is known to be one of the bottlenecks of c-Si cell line. It can also be integrated to in-line or off-line sorter for final inspection prior to shipping.

Backside Printing and Surface Inspection System

KEY FEATURES

• Capable to integrate to any c-Si cell line due to compact sizes
• Adjustable criteria for different process application or model
• Flexible algorithms programming editor for mono-crystalline and multi-crystalline silicon solar cells
• Multiple interface to communication with manufacturing equipment or information system
• Various defects inspection capability from multilayer LED lighting design
• Flexible design that can easily integrate to your in-line printing system and sorting system

 

OVERVIEW

Among several factors for PV to achieve grid-parity, reliability of the PV modules plays an important roll. Since it’s known that some of the cell defects such as edge chips/flakes, bumps of cell surface were proved to be source of infant mortality of the c-Si PV modules, therefore, to defect those defects is very important for c-Si cell manufacturers.

Due to the increasing BIPV and rooftop application, even for those defects that does not directly link to reliability issues such as water mark, surface stain, have to detected and considered as fail or secondary grade of cells for c-Si cell buyers. Conventionally, those defects were visually inspected by operators. But, the inconsistent inspect result makes fully automatic optical inspection (AOI) solution becomes unavoidable equipment for c-Si cell lines. Chroma 7200 series are specially designed for detection yield for wide variety of defects observed for c-Si cells for all sizes and crystallizations. Base on the process needs, three inspectors are available for both in-line and final sorting requirements.

 

Bump

Busbar Defect

Stain

Alignment Shift

 

CHROMA MOEL 7213-AD

Defects causes by back-side printing process of c-Si PV cells will also cause performance, reliability impact. Among all the back-side printing defects, bumps
caused by improper printing may cause high cell breakage rate during lamination of c-Si module process. Chroma 7213-AD c-Si cell back-side printing inspector uses unique lighting technique to detect common back-side printing defects plus most demanding bumps.

Another model Chroma 7213, with same inspection capability but was designed for special upward-detection. This brings unparallel advantage against conventional downward-detection design. With upward detection, the cell can be checked without being flipped twice which helps to minimize the cell breakage and reduce the production line length.

Same as Chroma 7212-HD, Chroma 7213-AD can be used after back-side process to retire cells with major defects. It can also be integrated to in-line
or off-line sorter for final inspection prior to shipping.

 

Final Classification & Sorting System

KEY FEATURES

• Good for 5 inches and 6 inches mono/multi-crystalline silicon cells
  
• High throughput and low breakage rate ≦0.2%
  
• Loader can automatically pick up and place cell finished by firing
  
• Efficiency and Color classes and Sorting Bins can be defined by customers' request
  
• Integrated with Inspector and IV Tester by customers' request
  
• High cell positioning repeatability to ensure consistent test result
  
• Sorting Bins can be extended by module

 

CHROMA MODEL 3730

Chroma 3730 Solar Cell Inspection Test / Sorting System is ideal for PV backend process. In loader it can automatically pick up and place PV cell finished by firing. Then it will inspect cell surface and backside defects and will automatically sort the cells into carrier by different efficiency and color classes defined by customers' request.

Breakage rate is a key concern for PV cell handling systems. Chroma 3730 uses state-of-the-art cell transportation techniques to ensure minimum breakage rate. Based on customer’s requirement of different processes, the carrier type and the amount of sorting bins also can be designed and adjusted.

 

Firing Unload

IV Testing

Handling

Sorting