The Choma 3530 Parametric Test System is a paradigm shift in wafer testing. Eery design feature produces lower cost per wafer, increased test quality and uncompromised coverage

Five Core Value Pillars

Key Differentiator: The 3530 supports heterogeneous and asynchronous DUT/algorithm combinations running simultaneously—maximizing resource utilization without compromise.

Lower Cost of Total Ownership

Direct Docking with No Long Cables

One Year Calibratin Interval

56 True Per-Pin Desgin Architecture

Powerful Software Tools and Test Shell - Hyperion Software

The 3530's parallel independent XMU-based testing architecture enables multiple "teams" to schedule different devices (transistors, resistors, capacitors) with different test algorithms, running simultaneously. This intelligent scheduling system operates automatically while offering manual customization options when needed, delivering unprecedented flexibility for mixed-device test scenarios.  With legacy instruments, these are automatically executed in serial without changes

Features

•No rack, zero footprint
•No switched matrix
•No long cables
•No external cabinet
•48 per-pin parallel Test
•SMU, CMU, PulseIV, PG +/-100V @ 100mA