Semiconductor / IC

Today’s logic IC has to integrate multiple functions. The complex System-on-Chip (SoC) is not only equipped with the features of digits, simulation, power and built-in storage, but is also a challenge for test devices.

The VLSI test system can precisely simulate the logic IC's electric signals and rapidly interpret the test results. The expansion of Test Head is capable of executing multiple test programs for massive multi-sites to improve the throughput. In addition, the customized test device can replace the general purpose tester to fit in the specified requirements that can actually meet the goal of reducing test cost.

In the back end of IC process, handlers are used to sort the products with different types of package. After package testing, the Automatic System Function Tester, which tests IC in a real environment instead of simulation by IC testers, are used for tests of complicated IC with high fault coverage and low cost and highly improves test quality.

IC Pick & Place Test Handlers

Model 3111

Mini Tabletop Single Site Test Handler

  • 600 mm x 565 mm x 800 mm
  • JEDEC trays (2)
  • IC packages: 5x5mm~45x45mm
  • Alerts to mobile device
  • Continuous automated re-test
Model 3110

Hybrid Single Site Test Handler

  • FT + SLT handler - two in one
  • Perfect for device engineering characterization gathering and analysis
  • Auto tray load/unload & device sorting capability
Model 3110-FT

Full Range Active Thermal Control Handler

  • Combination Final Test & System Level Test Handler (2-in-1 System)
  • Perfect for device engineering characterization gathering and analysis
  • Supports Remote Control Function
Model 3160

Final Test Handler

  • Flexible DUT Configuration
  • Adjustable P&P Interval
  • Air damper buffer to reduce contact force impact
  • Intelligent socket IC leftover check
Model 3180

Octal Site Test Handler

  • Up to x8 Parallel Test Sites
  • Up to 9000 UPH
  • Flexible Test Site Configuration
  • Dampened Contact Force
  • Contact Force Auto Learning
Model 3813

Touch Panel Multi-Sites IC Test Handler

  • Reliable Touch Panel Test Handler
  • For both digital and analog touch panel test
  • Touch panel size: 6 inch x 3 sites or 12/1 inch x 1 site
Model 3810

Touch Panel Semi-auto Handler

  • Reliable Panel Handler
  • Panel Size: 3" to 6.5"
  • Up to 6 sites for test at the same time
  • USB interface
  • No test panel contact force damage problem
Model 3280

xSD Card Tester and Handler

  • Tester & Handler Integration
  • Test 120pcs micro SD in parallel
  • Test-in Tray, no pick & place arm before sorting
  • UPH + 5400 with 70 sec test time
Model 3813

Touch Panel Multi-Sites IC Test Handler

  • Reliable Touch Panel Test Handler
  • For both digital and analog touch panel test
  • Touch panel size: 6 inch x 3 sites or 12/1 inch x 1 site

Automatic System Function Tester (ASFT)

Model 3260

Automatic System Function Tester (6-sites)

  • Reliable high-speed pick & place handler
  • Tester zero waiting time
  • Gull wing package capability
  • No socket damage

SoC Test System

Model 3650-S2

SoC/Analog Test System

  • 12 Universal slots for digital, analog, and mixed-signal applications
  • Up to 768 digital I/O and analog pins
  • 50 / 100 MHz clock rate;
  • 100 / 200 Mbps (MUX) data rate
Model 3650

SoC Test System

  • 50 / 100 MHz
  • 512 digital I/O pins
  • 16/32 MW vector memory
  • 16/32 MW pattern instruction memory
  • Multi-site testing up to 32 sites
Model 3680

Advanced SoC Test System

  • 24 interchangeable slots for digital, analog, and mixed-signal applications
  • 150 Mbps up to 1 Gbps data rate (muxed)
  • Up to 512 sites parallel test
  • Up to 2048 digital 1/0 pins
Model 33021

High Voltage Device Power Supply

  • Max. 48V DC output with 2 channels per card
  • -12V~48V independently programmable voltage level
  • Max. 250mA current per channel
Model 33010

High Speed PXIe Digital IO Card

  • Standard PXIe bus connector
  • 100MHz maximum clock rate
  • 32 channels per board
  • Extendable up to 256 channels in one chassis
  • Any pin to any site
Model 33011

Universal Relay Driver Control

  • PXI-e based universal relay control for semiconductor load boards
  • 32CH direct relay drivers
  • 2 lanes of SPI relay control interface
Model 33020

PXIe Programmable Device Power Supply

  • High channel density with 8 channels per card
  • -6V~12V independently programmable voltage level
Model HDAVO

High Density Audio Video Option

  • 8 channels of arbitrary waveform generator (AWG) and 8 channels of digitizer (DGT) per board
  • Provide high frequency mode and high resolution mode for both AWG and DGT

Metrology System

Model 7505

Semiconductor Optical Metrology System

  • Uses White Light Interference Measurement Technique to conduct nondestructive and rapid surface profile measurement and analysis.