Chroma's photonics test solutions address mainly on automated test equipment for laser diode, VSCEL, LED both in wafer and chip format as well as optical communication active components.

With more than 30 years of power electronic and automated optical test experience, Chroma offers many integrated mechanism and temperature control technology capable of performing reliable characteristics and aging test for optical devices under various temperature test conditions.

Test Systems

Model 58604

Laser Diode Burn-in and Reliability Test System

  • Applicable for burn-in, reliability, and life testing
  • AAC and APC control modes
  • Individual channel driving and measurement
Model 58605

High Power Laser Diode Burn-in and Reliability Test System

  • Burn-in, reliability, and life test
  • AAC and APC control modes
  • Independent channel for source and measurement
  • Spike-Free sourcing
Model 58602

Optoelectronic Source Measurement System

  • Burn-in, Reliability, and Life Testing
  • Up to 6912 Channels
  • Up to 20A per device
  • Up to 150°C
  • CoS, C-Mount, T0, VCSEL Card, VCSEL Package, Custom
Model 58606

Photodioe Burn-in and Reliability Test System

  • Burn-in, reliability, and life test
  • Dark Current and Breakdown Voltage
  • 256 channels Bi-polar device source per drawer
Model 58620

Laser Diode Characterization System

  • Full Turn-Key Automated Test for edge and surface emitting laser diodes
  • High precision and large capacity carrier, interchangeable with other automated equipment
Model 58635

Photonic Array Wafer Probing Test System

  • References: ISO/IEC standards
  • Up to 6” water
  • Wide range and precise temperature control
Model 58212-C

LED mapping Probe Tester Model

  • High speed and accuracy
  • Lateral, verticle, and flip chip
  • Wide power test range (up to 200V/2A)
  • Up to 8" wafers
  • Chroma® Huge Photo Detector
Model 58625

Photonics Module Test System

  • All-in-one test system
  • Flexible test station arrangement
  • Precise temperature control -20~85°C
  • Large bea angl measurement
  • Nanosecond high-speed testing (optional)

Inspection Systems

Model 7945

In-process Wafer Die Inspection System

  • Double-side inspection (post-diced wafer)
  • Full color defect detection
  • Selectable resolution and algorithms: VCSELs, PDs, LEDs, and Discrete Devices
Model 7940

Wafer Chip Inspection System

  • Simultaneous double-side color inspection
  • 6” wafer / 8” inspection area
  • Automatic wafer alignment
  • Wafer shape / edge identification
Model 7661A

Optical Micro Display Test System

  • Optical tests
  • Automatic DUT Handler
  • Class 1000/10000 Options
  • SMART Factory Compliant
  • Flicker Measurement & Adjustment
Model 7661-K003

Mini LED Backlight Module Automatic Optical Test System

  • Comprehensive characterization:
    • Chromaticity
    • Luminance
    • Uniformity
    • Dies defect
    • Voltage/Current
Model 7503

3D Optical Profiler

  • Up to 0.1 nm height resolution for measurement
  • Use white light interference measurement technique to do nondestructive and rapid surface texture measurement and analysis
Model 7505-01

Multi-function Optical Profiling System

  • 1D, 2D, and 3D measurement capabilities


Model 52400 Series

Four Quadrant Source

  • High & programmable voltage / current slew rate
  • Low output noise
  • High programming / measurement speed
Model 54100

Advanced TEC Controller

  • Bidirectional driving with 300W (27V/12A) and 800W (40V/20A) output
  • Filtered PWM output with >90% driving power efficiency
Model 58154

ESD Test System

  • Two Model ESD Pulse Generation : Human body model and Machine model
  • Programmable Auto Test : Pulse delay, cycle, and polarity are programmable
Model 51101 / 51101C

Thermal/Multi-Function Data Logger

  • Models with 1, 8, and 64 channels on-line data recording.
  • Support B, E, J, K, N, R, S, and T type thermal couples