Model 58605
High Power Laser Diode Burn-In and Reliability Test System
Key Features
- Burn-In, reliability, and life test
- ACC and APC control modes
- Independent channel driving and measurement
- Proprietary spike-free SMU design
- Up to 6000mA single-channel and pulsing
- Precise TEC temperature control
- Modular design flexibility and easy maintenance
- Software auto reconnection
- ESD protection (device interface)
