Model 58606
Photodiode Burn-in and Reliability Test System
Key Features
- Burn-In, reliability, and life test
- Dark Current and Breakdown Voltage
- 256 channels Bi-polar device source
- High bias source to 80 volts
- Spike free source for device protection
- Programmable output for each source
- Independent sub drawer start/stop control
- Per carrier temperature control
- High precision probing for die level burn-in
