Product Details
Semiconductor manufacturing is a fast-moving industry. Devices today are highly integrated, with multiple functions incorporated into a single piece of silicon. Consequently, capital equipment must be designed to outlive several device generations. Chroma's latest SoC Test System, the 3680, provides flexible configurations and a wide range of coverage, enabling you to test various device types on a single platform. Thus, protecting the customer's investment.
Key Features
- 24 interchangeable slots for digital, analog and mixed-signal applications
- Data rate up to 1Gbps
- Up to 2048 sites parallel test
- Up to 2048 digital I/O pins
- 256 MW vector memory (512 MW option) (X2 mode)
- Up to 64 CH PMU for high precision measurement
- Per-pin timing measurement unit / PPMU / frequency measurement
- SCAN up to 64 chains / 16G depth
- Edge placement accuracy (EPA): ±150ps
- Up to 128 CH High density DPS32
- High density HDADDA2 mixed-signal option
- Efficient high power HCDPS analog option
- High performance HDAVO option
- High parallel HDRF option*
- Direct probing system*
- Multi-time domain function*
- Microsoft Windows® 10 OS
- C#.NET and GUI programming interface
- CRISPro, full suite of intuitive software tools
- Test program and pattern converters for other platforms
- Accept PIB and probe card of other testers directly
- Support STDF data output and customized data format
- Air-cooled, small footprint tester-in-a-test-head design
Flexible and Various Options System
The system is flexible to deploy the conflagration up to 2048 pins within 24 universal slots with the digital performance up to 1Gbps, the largest default 256MW vector memory, ±150ps EPA for superior timing accuracy in high speed application, and provides various options such as HDADDA2 for converter test, HDVI for high voltage & automotive, HDAVO for performance mix-signal with video applications of 400Msps AWG & 250Msps DIG and another high precision audio application of 24bit AWG & DIG.
The 3680 also includes mainframe cabinet containing AC, DC power distribution unit and system power supply. An optional test head manipulator is offered for docking with automated device handing equipment. The system is specifically designed for high-throughput and high parallel testing capability to provide the best solution for fabless, IDM and testing houses. With full functions of test capability, high accuracy, powerful software, and excellent reliability, the 3680 is ideal for testing consumer devices, high-performance microcontrollers, analog devices and SoC devices.
